TLP measurements for verification of ESD protection device response

被引：13
|
作者：
Hyatt, H. [1 ]
Harris, J. [1 ]
Alonzo, A. [1 ]
Bellew, P. [1 ]
机构：
[1] Hyger Physics, Inc., Bremerton, WA 98312, United States
来源：
| 2001年 / Institute of Electrical and Electronics Engineers Inc.卷 / 24期
关键词：
D O I：
10.1109/6104.930959
中图分类号：
学科分类号：
摘要：
15
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