Reproducibility of transmission line measurement of bipolar I-V characteristics of MOSFET's

被引：0
|
作者：
Department of Physics, University of Hong Kong, Hong Kong, Hong Kong [1 ]
不详 [2 ]
机构：
来源：
IEEE Trans. Instrum. Meas. | / 3卷 / 721-723期
关键词：
D O I：
暂无
中图分类号：
学科分类号：
摘要：
引用
收藏
相关论文
共 50 条
  • [41] I-V characteristics of metal/polynitrobenzene junctions
    Zheng, HP
    Zhang, RF
    Huang, JS
    Liu, SY
    Shen, JC
    CHINESE PHYSICS LETTERS, 1997, 14 (05) : 375 - 378
  • [42] Temperature Dependence of I-V Characteristics for CNT Based p-i-n TFET and n-i-n MOSFET
    Shirazi, Shaahin G.
    Karimi, Gholamreza
    Mirzakuchaki, Sattar
    ECS JOURNAL OF SOLID STATE SCIENCE AND TECHNOLOGY, 2016, 5 (06) : M44 - M50
  • [43] Prediction of entanglement detection by I-V characteristics
    Zibold, T.
    Vogl, P.
    Bertoni, A.
    NONEQUILIBRIUM CARRIER DYNAMICS IN SEMICONDUCTORS PROCEEDINGS, 2006, 110 : 15 - +
  • [44] PREDICTION OF TUNNEL DIODE I-V CHARACTERISTICS
    ROY, DK
    SOLID-STATE ELECTRONICS, 1971, 14 (06) : 520 - &
  • [45] Nonlinear I-V characteristics of polymer nanocomposites
    Herth, Simone
    Nanofair 2006 New Ideas for Industry, 2006, 1940 : 55 - 55
  • [46] Measuring photovoltaic cell I-V characteristics
    Lowe, R
    EE-EVALUATION ENGINEERING, 1998, 37 (08): : 40 - +
  • [47] ON THE I-V CHARACTERISTICS OF THE L-CATHODE
    RITTNER, ES
    AHLERT, RH
    PHYSICAL REVIEW, 1952, 85 (02): : 390 - 390
  • [48] I-V CHARACTERISTICS OF SUPERCONDUCTING TUNNEL JUNCTIONS
    ALBEGOVA, IK
    BORODAI, BI
    YANSON, IK
    DMITRENK.IM
    SOVIET PHYSICS TECHNICAL PHYSICS-USSR, 1969, 14 (05): : 681 - +
  • [49] Nonlinear I-V characteristics of a mesoscopic conductor
    Wang, BG
    Wang, J
    Guo, H
    JOURNAL OF APPLIED PHYSICS, 1999, 86 (09) : 5094 - 5102
  • [50] Switching Trajectory Control of SiC MOSFET Based on I-V Characteristics Using Digital Active Gate Driver
    Takayama, Hajime
    Fukunaga, Shuhei
    Hikihara, Takashi
    2021 IEEE 12TH ENERGY CONVERSION CONGRESS AND EXPOSITION - ASIA (ECCE ASIA), 2021, : 1338 - 1343
12345