Characteristics of a silicon detector for industrial X-ray computed tomography

被引：0
|
作者：
机构：
来源：
Nucl Instrum Methods Phys Res Sect A | / 1-3卷 / 97期
关键词：
D O I：
暂无
中图分类号：
学科分类号：
摘要：
引用
收藏
相关论文
共 50 条
  • [1] CHARACTERISTICS OF A SILICON DETECTOR FOR INDUSTRIAL X-RAY COMPUTED-TOMOGRAPHY
    MIYAI, H
    KITAGUCHI, H
    KAWASAKI, S
    IZUMI, S
    [J]. NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT, 1994, 353 (1-3): : 97 - 100
  • [2] Industrial X-ray computed tomography
    Pechstein, Torsten
    [J]. TM-TECHNISCHES MESSEN, 2020, 87 (02) : 79 - 80
  • [3] Industrial computed X-ray tomography
    Luthi, T
    Flisch, A
    Wyss, P
    [J]. INSIGHT, 1998, 40 (03) : 196 - 197
  • [4] Characterization of a flat-panel amorphous silicon detector for X-ray computed tomography
    Lee, H.-R.
    Ellingson, W.
    [J]. Journal of X-Ray Science and Technology, 2001, 9 (01) : 43 - 53
  • [5] RESPONSE OF SILICON DETECTOR FOR HIGH-ENERGY X-RAY COMPUTED-TOMOGRAPHY
    MIYAI, H
    KAWASAKI, S
    KITAGUCHI, H
    IZUMI, S
    [J]. IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 1994, 41 (04) : 999 - 1003
  • [6] Coordinate measuring with industrial X-ray computed tomography
    Hiller, Jochen
    Kasperl, Stefan
    Hilpert, Uwe
    Bartscher, Markus
    [J]. TM-TECHNISCHES MESSEN, 2007, 74 (11) : 553 - 564
  • [7] APPLICATIONS OF INDUSTRIAL X-RAY COMPUTED TOMOGRAPHY IN PALAEONTOLOGY
    Prokop, J.
    Jancarek, A.
    Pina, L.
    Trojek, T.
    Martincik, J.
    Ekrt, B.
    [J]. EUROPEAN NDT DAYS IN PRAGUE 2007: NDT IN PROGRESS, PROCEEDINGS, 2007, : 135 - 142
  • [8] Conebeam X-ray computed tomography with an offset detector array
    Gregor, J
    Gleason, SS
    Paulus, MJ
    [J]. 2003 INTERNATIONAL CONFERENCE ON IMAGE PROCESSING, VOL 2, PROCEEDINGS, 2003, : 803 - 806
  • [9] Monolithically integrated X-ray detector arrays for computed tomography
    Sudharsanan, R
    Yoganathan, M
    Vakerlis, G
    Ferekides, CS
    McCandless, B
    Birkmire, R
    Deych, R
    Luhta, R
    [J]. SEMICONDUCTORS FOR ROOM-TEMPERATURE RADIATION DETECTOR APPLICATIONS II, 1997, 487 : 573 - 578
  • [10] Characterization of a spectroscopic detector for application in x-ray computed tomography
    Dooraghi, Alex A.
    Fix, Brian J.
    Smith, Jerel A.
    Brown, William D.
    Azevedo, Stephen G.
    Martz, Harry E.
    [J]. DEVELOPMENTS IN X-RAY TOMOGRAPHY XI, 2017, 10391
12345