STUDIES OF THE POSSIBILITY OF ELIMINATING THE CMOS LATCH-UP BY ELECTRON IRRADIATION.

被引：0
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作者：
Huang Huiling
Xu Shouxiang
Qui Xingyong
Zhang Xiumiao
Su Jiuling
Bao Zongming
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来源：
Pan Tao Ti Hsueh Pao/Chinese Journal of Semiconductors | 1982年 / 3卷 / 06期
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Compendex;
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摘要：
TRANSISTORS
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页码：509 / 511
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