Research on testing pattern generation for digital circuits using satisfiability approach

被引：0
|
作者：
Zeng, C.B.
Chen, G.J.
机构：
来源：
| 2001年 / Science Press卷 / 22期
关键词：
D O I：
暂无
中图分类号：
学科分类号：
摘要：
引用
收藏
相关论文
共 50 条
  • [11] Automatic test pattern generation for crosstalk glitches in digital circuits
    Lee, KT
    Nordquist, C
    Abraham, JA
    16TH IEEE VLSI TEST SYMPOSIUM, PROCEEDINGS, 1998, : 34 - 39
  • [12] An efficient diagnostic test pattern generation framework using Boolean satisfiability
    Zheng, Feijun
    Cheng, Kwang-Ting
    Yan, Xiaolang
    Moondanos, John
    Hanna, Ziyad
    PROCEEDINGS OF THE 16TH ASIAN TEST SYMPOSIUM, 2007, : 288 - +
  • [13] ORGANIZATION OF TESTING OF 4TH-GENERATION DIGITAL CIRCUITS
    ALUMJAN, RS
    STEPANJAN, SO
    PAPJAN, GG
    ASOJAN, ML
    AVTOMATIKA I VYCHISLITELNAYA TEKHNIKA, 1987, (04): : 87 - 88
  • [14] Test pattern generation for multiple output digital circuits using cubical calculus and Boolean differences
    Takhar, JS
    Gilbert, DJ
    40TH MIDWEST SYMPOSIUM ON CIRCUITS AND SYSTEMS, VOLS 1 AND 2, 1998, : 409 - 412
  • [15] Evolutionary approach to the functional test generation for digital circuits
    Skobtsov, YA
    Ivanov, DE
    Skobtsov, VY
    Ubar, R
    BEC 2004: PROCEEDING OF THE 9TH BIENNIAL BALTIC ELECTRONICS CONFERENCE, 2004, : 229 - 232
  • [16] GENERATION OF CONNECTION MATRICES FOR DIGITAL-SIMULATION OF CONVERTER CIRCUITS USING THE TENSOR APPROACH
    ONG, CM
    LIU, CT
    LU, CN
    IEEE TRANSACTIONS ON POWER SYSTEMS, 1987, 2 (04) : 906 - 912
  • [17] On the modelling of digital circuits for the test pattern generation for device input faults
    Dokouzyannis, Stavros P.
    Microelectronics Reliability, 1994, 34 (12) : 1923 - 1929
  • [18] ON THE MODELING OF DIGITAL CIRCUITS FOR THE TEST PATTERN GENERATION FOR DEVICE INPUT FAULTS
    DOKOUZYANNIS, SP
    MICROELECTRONICS AND RELIABILITY, 1994, 34 (12): : 1923 - 1929
  • [19] Robust Algorithms for High Quality Test Pattern Generation Using Boolean Satisfiability
    Eggersgluess, Stephan
    Drechsler, Rolf
    INTERNATIONAL TEST CONFERENCE 2010, 2010,
  • [20] TEST PATTERN GENERATION FOR BENCHMARK CIRCUITS using LFSR
    VinodChandra, Chengani
    Ramasamy, S.
    2013 FOURTH INTERNATIONAL CONFERENCE ON COMPUTING, COMMUNICATIONS AND NETWORKING TECHNOLOGIES (ICCCNT), 2013,
12345