HEAVILY Sn-DOPED GaAs BUFFER LAYERS FOR AlGaAs/GaAs HBTs.

被引:0
|
作者
Ito, Hiroshi [1 ]
Ishibashi, Tadao [1 ]
机构
[1] NTT, Atsugi, Jpn, NTT, Atsugi, Jpn
关键词
D O I
暂无
中图分类号
学科分类号
摘要
SEMICONDUCTING GALLIUM ARSENIDE
引用
下载
收藏
页码:707 / 709
相关论文
共 50 条
  • [41] CARBON-DOPED BASE ALGAAS GAAS HBTS GROWN BY MOCVD USING TMAS
    ITO, H
    KOBAYASHI, T
    ISHIBASHI, T
    ELECTRONICS LETTERS, 1989, 25 (19) : 1302 - 1303
  • [42] Heavily carbon-doped GaAs grown by movpe using carbon tetrabromide for HBTs
    Wu, HZ
    MATERIALS RESEARCH BULLETIN, 1996, 31 (01) : 97 - 105
  • [43] High gain AlGaAs/GaAs HBTs grown by MOCVD
    Welser, RE
    Pan, N
    Vu, DP
    Knowles, MA
    Taulananda, I
    Miller, JG
    Stillman, GE
    1997 IEEE INTERNATIONAL SYMPOSIUM ON COMPOUND SEMICONDUCTORS, 1998, : 451 - 454
  • [44] High gain AlGaAs/GaAs HBTs grown by MOCVD
    Welser, RE
    Pan, N
    Vu, DP
    Knowles, MA
    Taulananda, I
    Miller, JG
    Stillman, GE
    COMPOUND SEMICONDUCTORS 1997, 1998, 156 : 451 - 454
  • [45] Sn-DOPED GaAs FILMS GROWN BY MOLECULAR BEAM EPITAXY.
    Fujii, Toshio
    Suzuki, Hidetake
    Hiyamizu, Satoshi
    Fujitsu Scientific and Technical Journal, 1979, 15 (04): : 121 - 130
  • [46] SN-DOPED GAAS FILMS GROWN BY MOLECULAR-BEAM EPITAXY
    FUJII, T
    SUZUKI, H
    HIYAMIZU, S
    FUJITSU SCIENTIFIC & TECHNICAL JOURNAL, 1979, 15 (04): : 121 - 130
  • [47] Screening for early and rapid degradation in GaAs/AlGaAs HBTs
    Henderson, T
    Tutt, M
    1997 IEEE INTERNATIONAL RELIABILITY PHYSICS SYMPOSIUM PROCEEDINGS - 35TH ANNUAL, 1997, : 253 - 260
  • [48] Charge-collection mechanisms of AlGaAs/GaAs HBTs
    McMorrow, D
    Melinger, JS
    Knudson, AR
    Buchner, S
    Campbell, AB
    Curtice, WR
    IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 1997, 44 (06) : 2274 - 2281
  • [49] Degradation of AlGaAs/GaAs HBTs induced by hot carriers
    Song, CK
    Kim, DY
    Choi, PJ
    Choi, JH
    Kim, DH
    MICROELECTRONICS RELIABILITY, 1998, 38 (12) : 1907 - 1912
  • [50] Effect of the base dopant concentration on the stability of Be-doped AlGaAs/GaAs HBTs devices
    Borgarino, Mattia
    Losi, Raffaele
    Fantini, Fausto
    SchuBler, Martin
    Hartnagel, Hans Ludwig
    Franchi, Secondo
    Bosacchi, Antonio
    Alta Frequenza Rivista Di Elettronica, 1997, 9 (05): : 56 - 59