NDI assessment of CMC (C/C-SiC) manufacturing

被引：0
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作者：
Aoki, R.M. [1 ]
Schanz, P. [1 ]
机构：
[1] DLR (German Aerospace Research Cent), Stuttgart, Germany
来源：
Insight: Non-Destructive Testing and Condition Monitoring | 1999年 / 41卷 / 03期
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页码：173 / 175
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