TESTING METHOD FOR STATIC RANDOM ACCESS MEMORY.

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作者：
Madhaven, R.
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Electronic Engineering (London) | 1977年 / 49卷 / 596期
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摘要：
Many people find it difficult to test even the static memory chips in their laboratories since there is no facility of testing units for checking them as they have for the other integrated circuits. This can be avoided by a test setup described.
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