High-frequency capacitance-voltage measurements in thin-film epitaxial GaAs structures

被引：0
|
作者：
Gorev, N.B. [1 ]
Makarova, T.V. [1 ]
Prokhorov, E.F. [1 ]
Ukolov, A.T. [1 ]
Eppel', V.I. [1 ]
机构：
[1] Inst Tekhnicheskoj Mekhaniki AN, Ukrainy, Kiev, Ukraine
来源：
Mikroelektronika | 1995年 / 24卷 / 01期
关键词：
Thin films;
D O I：
暂无
中图分类号：
学科分类号：
摘要：
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页码：44 / 47
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