High-frequency capacitance-voltage measurements in thin-film epitaxial GaAs structures

被引：0
|
作者：
Gorev, N.B. [1 ]
Makarova, T.V. [1 ]
Prokhorov, E.F. [1 ]
Ukolov, A.T. [1 ]
Eppel', V.I. [1 ]
机构：
[1] Inst Tekhnicheskoj Mekhaniki AN, Ukrainy, Kiev, Ukraine
来源：
Mikroelektronika | 1995年 / 24卷 / 01期
关键词：
Thin films;
D O I：
暂无
中图分类号：
学科分类号：
摘要：
引用
收藏
页码：44 / 47
相关论文
共 50 条
  • [1] High-frequency capacitance-voltage characteristic of GaAs-based, thin-film structures
    Gorev, NB
    Makarova, TV
    Prokhorov, EF
    Ukolov, AT
    Eppel, VI
    SEMICONDUCTORS, 1997, 31 (01) : 78 - 80
  • [2] High-frequency capacitance-voltage characteristic of GaAs-based, thin-film structures
    N. B. Gorev
    T. V. Makarova
    E. F. Prokhorov
    A. T. Ukolov
    V. I. Éppel’
    Semiconductors, 1997, 31 : 78 - 80
  • [3] CAPACITANCE-VOLTAGE CHARACTERISTICS OF THIN-FILM STRUCTURES MADE OF N-TYPE GAAS
    GOREV, NB
    KOSTYLEV, SA
    MAKAROVA, TV
    PROKHOROV, EF
    UKOLOV, AT
    SOVIET PHYSICS SEMICONDUCTORS-USSR, 1992, 26 (05): : 485 - 488
  • [4] A Frequency-Dependent Capacitance-Voltage Model for Thin-Film Transistors
    Guo, Xuekai
    Wang, Mingxiang
    Han, Zhiyuan
    IEEE TRANSACTIONS ON ELECTRON DEVICES, 2016, 63 (04) : 1666 - 1673
  • [5] Capacitance-voltage characteristics of organic thin-film transistors
    Gelinck, G. H.
    van Veenendaal, Erik
    van der Vegte, H.
    Coehoorn, R.
    ORGANIC FIELD-EFFECT TRANSISTORS VI, 2007, 6658
  • [6] HIGH-FREQUENCY MEASUREMENTS OF THIN-FILM TRANSISTORS
    DEGRAAFF, HC
    SOLID-STATE ELECTRONICS, 1967, 10 (01) : 51 - &
  • [7] NONMONOTONIC CAPACITANCE-VOLTAGE CHARACTERISTICS OF THIN-FILM SCHOTTKY-BARRIER SEMICONDUCTOR STRUCTURES
    GOREV, NB
    KOSTYLEV, SA
    MAKAROVA, TV
    PROKHOROV, EF
    UKOLOV, AT
    SOVIET PHYSICS SEMICONDUCTORS-USSR, 1989, 23 (02): : 220 - 221
  • [8] Photocapacitance of GaAs thin-film epitaxial structures
    Gorev, NB
    Kodzhespirova, IF
    Privalov, EN
    Khuchua, N
    Khvedelidze, L
    Shur, MS
    SOLID-STATE ELECTRONICS, 2005, 49 (03) : 343 - 349
  • [9] Peculiarities of high-frequency C-V measurements in n-type GaAs thin-film structures
    Kostylev, SA
    Prokhorov, EF
    Gorev, NB
    Kodzhespirova, IF
    SOLID-STATE ELECTRONICS, 1997, 41 (05) : 784 - 786
  • [10] An Analytical Frequency-Dependent Capacitance-Voltage Model for Metal Oxide Thin-Film Transistors
    Xiang, Kai
    Li, Hao-Yang
    Li, Fei-Fan
    Xu, Hua
    Zhou, Lei
    Xu, Miao
    Wang, Lei
    Wu, Wei-Jing
    Peng, Jun-Biao
    IEEE TRANSACTIONS ON ELECTRON DEVICES, 2022, 69 (01) : 141 - 146
12345