共 50 条
- [1] Overlay accuracy evaluation in step-and-repeat X-ray lithography Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers, 1988, 27 (07): : 1275 - 1280
- [2] A STEP-AND-REPEAT X-RAY-LITHOGRAPHY SYSTEM SR-1 .2. ALIGNMENT SYSTEM BULLETIN OF THE JAPAN SOCIETY OF PRECISION ENGINEERING, 1982, 16 (03): : 197 - 198
- [3] A STEP-AND-REPEAT X-RAY-LITHOGRAPHY SYSTEM SR-1 .1. SYSTEM-DESIGN BULLETIN OF THE JAPAN SOCIETY OF PRECISION ENGINEERING, 1982, 16 (03): : 195 - 196
- [4] OVERLAY ACCURACY EVALUATION IN STEP-AND-REPEAT X-RAY-LITHOGRAPHY JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS BRIEF COMMUNICATIONS & REVIEW PAPERS, 1988, 27 (07): : 1275 - 1280
- [5] A STEP-AND-REPEAT X-RAY-LITHOGRAPHY SYSTEM SR-1 .3. POSITIONING MECHANISM SYSTEM BULLETIN OF THE JAPAN SOCIETY OF PRECISION ENGINEERING, 1982, 16 (03): : 199 - 200
- [7] A STEP-AND-REPEAT X-RAY-EXPOSURE SYSTEM FOR 0.5-MU-PATTERN REPLICATION JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1985, 3 (06): : 1581 - 1586
- [10] Development of X-ray stepper with high overlay accuracy for 100-nm LSI lithography INITIATIVES OF PRECISION ENGINEERING AT THE BEGINNING OF A MILLENNIUM, 2001, : 604 - 608