Surfactant influence on the Ge heteroepilayer on Si(0 0 1) studied by X-ray diffraction and atomic force microscopy

被引:0
|
作者
Fundan Univ, Shanghai, China [1 ]
机构
来源
J Cryst Growth | / 1-2卷 / [d]115-119期
关键词
Number:; -; Acronym:; NSFC; Sponsor: National Natural Science Foundation of China;
D O I
暂无
中图分类号
学科分类号
摘要
引用
收藏
相关论文
共 50 条
  • [41] Structural properties of MOVPE-grown ZnSe studied by X-ray diffractometry, atomic force microscopy and electron microscopy
    Liu, Q
    Lakner, H
    Taudt, W
    Heuken, M
    Mendorf, C
    Heime, K
    Kubalek, E
    GROWTH, CHARACTERISATION AND APPLICATIONS OF BULK II-VIS, 1999, 78 : 507 - 512
  • [42] Structural properties of MOVPE-grown ZnSe studied by X-ray diffractometry, atomic force microscopy and electron microscopy
    Gerhard-Mercator-Universitaet, Duisburg, Duisburg, Germany
    J Cryst Growth, 3 (507-512):
  • [44] Coherent atomic motions in a nanostructure studied by femtosecond x-ray diffraction
    Bargheer, M
    Zhavoronkov, N
    Gritsai, Y
    Woo, JC
    Kim, DS
    Woerner, M
    Elsaesser, T
    SCIENCE, 2004, 306 (5702) : 1771 - 1773
  • [45] Atomic force microscopy observations of hollow cores on the {1 1 1} and {1 0 0} faces of barium nitrate
    Plomp, M
    Maiwa, K
    van Enckevort, WJP
    JOURNAL OF CRYSTAL GROWTH, 1999, 198 : 246 - 252
  • [46] Atomic force microscopy observations of hollow cores on the {1 1 1} and {1 0 0} faces of barium nitrate
    Plomp, M.
    Maiwa, K.
    van Enckevort, W.J.P.
    Journal of Crystal Growth, 1999, 198-199 (pt 1): : 246 - 252
  • [47] Study of Si caplayer influence on microstructure of Ge/Si quantum dots by grazing incident X-ray diffraction
    He, Qing
    Jia, Quan-Jie
    Jiang, Xiao-Ming
    Cui, Jian
    Jiang, Zui-Min
    Kao Neng Wu Li Yu Ho Wu Li/High Energy Physics and Nuclear Physics, 2003, 27 (SUPPL.):
  • [48] Atomic force microscopy and x-ray diffraction studies on agglomeration phenomena of ultrathin Au/Fe bilayers
    Kamiko, Masao
    Koo, Jung-Woo
    Kim, Jae-Min
    Ha, Jae-Geun
    JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A, 2012, 30 (03):
  • [49] Study of Si caplayer influence on microstructure of Ge/Si quantum dots by grazing incident X-ray diffraction
    He, Q
    Jia, QJ
    Jiang, XM
    Cui, J
    Jiang, ZM
    HIGH ENERGY PHYSICS AND NUCLEAR PHYSICS-CHINESE EDITION, 2003, 27 : 49 - 52
  • [50] X-RAY DIFFRACTION AND ATOMIC FORCE MICROSCOPY STUDIES OF CHEMICAL BATH DEPOSITED FeS THIN FILMS
    Kassim, Anuar
    Min, Ho Soon
    Sharif, Atan
    Nagalingam, Saravanan
    STUDIA UNIVERSITATIS BABES-BOLYAI CHEMIA, 2010, 55 (03): : 5 - 11