共 50 条
- [21] Atomic ordering in nanosized PtxAu1-x (x=0, 0.51, 1) by resonant X-ray diffraction and differential atomic pair distribution functions ZEITSCHRIFT FUR KRISTALLOGRAPHIE-CRYSTALLINE MATERIALS, 2012, 227 (05): : 262 - 267
- [24] Tetracene film morphology: Comparative atomic force microscopy, X-ray diffraction and ellipsometry investigations The European Physical Journal E, 2008, 27 : 421 - 424
- [25] Skin lipid phase behaviour: An x-ray diffraction and atomic force microscopy study. 23RD INTERNATIONAL SYMPOSIUM ON CONTROLLED RELEASE OF BIOACTIVE MATERIALS, 1996 PROCEEDINGS, 1996, : 313 - 314
- [27] Investigation of nucleation and initial stage of GaN growth by atomic force microscopy and X-ray diffraction NITRIDE SEMICONDUCTORS, 1998, 482 : 93 - 98
- [28] Tetracene film morphology: Comparative atomic force microscopy, X-ray diffraction and ellipsometry investigations EUROPEAN PHYSICAL JOURNAL E, 2008, 27 (04): : 421 - 424
- [30] Effects of annealing parameters on residual stress and piezoelectric performance of ZnO thin films studied by X-ray diffraction and atomic force microscopy JOURNAL OF APPLIED CRYSTALLOGRAPHY, 2019, 52 : 951 - 959