Measurement of the Profile and the Dihedral Angle of Grain Boundary Grooves by Atomic Force Microscopy

被引：0

作者：

Schöllhammer, J. ^{[1
]}

Chang, L.-S. ^{[1
]}

Rabkin, E. ^{[2
]}

Baretzky, B. ^{[1
]}

Gust, W. ^{[1
]}

Mittemeijer, E.J. ^{[1
]}

机构：

[1] Max Planck Institute for Metals Research, Institute of Physical Metallurgy, University of Stuttgart, Stuttgart, Germany

[2] TECHNION-Israel Institute of Technology, Haifa, Israel

来源：

International Journal of Materials Research | 1999年 / 90卷 / 09期

关键词：

Atomic force microscopy - Grain boundaries;

D O I：

暂无

中图分类号：

学科分类号：

摘要：

Grain boundary grooves of pure Cu and Cu-50 at.ppm Bi bicrystals were measured by means of atomic force microscopy. An unprecedented accuracy was attained with this method. An analytical function proposed by Mullins for the grooving process was fitted to the measured groove profile. Extrapolation of this fitted function in the groove root of the profile led to accurate values of the dihedral angle. © 1999 Carl Hanser Verlag. All rights reserved.

引用

页码：687 / 690

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