Measurement of the Profile and the Dihedral Angle of Grain Boundary Grooves by Atomic Force Microscopy

被引：0

作者：

Schöllhammer, J. ^{[1
]}

Chang, L.-S. ^{[1
]}

Rabkin, E. ^{[2
]}

Baretzky, B. ^{[1
]}

Gust, W. ^{[1
]}

Mittemeijer, E.J. ^{[1
]}

机构：

[1] Max Planck Institute for Metals Research, Institute of Physical Metallurgy, University of Stuttgart, Stuttgart, Germany

[2] TECHNION-Israel Institute of Technology, Haifa, Israel

来源：

International Journal of Materials Research | 1999年 / 90卷 / 09期

关键词：

Atomic force microscopy - Grain boundaries;

D O I：

暂无

中图分类号：

学科分类号：

摘要：

Grain boundary grooves of pure Cu and Cu-50 at.ppm Bi bicrystals were measured by means of atomic force microscopy. An unprecedented accuracy was attained with this method. An analytical function proposed by Mullins for the grooving process was fitted to the measured groove profile. Extrapolation of this fitted function in the groove root of the profile led to accurate values of the dihedral angle. © 1999 Carl Hanser Verlag. All rights reserved.

引用

页码：687 / 690

共 50 条

[31] Measurement of colloidal forces with atomic force microscopy
Sokolov, Igor
ABSTRACTS OF PAPERS OF THE AMERICAN CHEMICAL SOCIETY, 2012, 244
[32] Atomic Force Microscopy Measurement of the Resistivity of Semiconductors
V. A. Smirnov
R. V. Tominov
N. I. Alyab’eva
M. V. Il’ina
V. V. Polyakova
Al. V. Bykov
O. A. Ageev
Technical Physics, 2018, 63 : 1236 - 1241
[33] Position measurement using atomic force microscopy
Doi, O
Torii, A
Ueda, A
MHS2001: PROCEEDINGS OF THE 2001 INTERNATIONAL SYMPOSIUM ON MICROMECHATRONICS AND HUMAN SCIENCE, 2001, : 143 - 148
[34] Atomic Force Microscopy Measurement of the Resistivity of Semiconductors
Smirnov, V. A.
Tominov, R. V.
Alyab'eva, N. I.
Il'ina, M. V.
Polyakova, V. V.
Bykov, Al. V.
Ageev, O. A.
TECHNICAL PHYSICS, 2018, 63 (08) : 1236 - 1241
[35] Adaptive-angle scanning method for 3D measurement with atomic force microscopy
Zhang, Rui
Wu, Sen
Liu, Lu
Fu, Xing
Gao, Si-Tian
Hu, Xiao-Dong
MEASUREMENT SCIENCE AND TECHNOLOGY, 2019, 30 (09)
[36] Direct measurement of the contact angle of water droplet on quartz in a reservoir rock with atomic force microscopy
Deng, Yajun
Xu, Lei
Lu, Hailong
Wang, Hao
Shi, Yongmin
CHEMICAL ENGINEERING SCIENCE, 2018, 177 : 445 - 454
[37] Comparison of roughness measurement with atomic force microscopy and interference microscopy
Kühle, A
Rosén, BG
Garnaes, J
ADVANCED CHARACTERIZATION TECHNIQUES FOR OPTICS, SEMICONDUCTORS, AND NANOTECHNOLOGIES, 2003, 5188 : 154 - 161
[38] MEASURING THE DIHEDRAL ANGLE OF WATER AT A GRAIN-BOUNDARY IN ICE BY AN OPTICAL DIFFRACTION METHOD
WALFORD, MER
NYE, JF
JOURNAL OF GLACIOLOGY, 1991, 37 (125) : 107 - 112
[39] Optimization of Measurement of the Interaction Force Vector in Atomic Force Microscopy
A. V. Ankudinov
A. M. Minarskii
Technical Physics, 2021, 66 : 835 - 850
[40] Optimization of Measurement of the Interaction Force Vector in Atomic Force Microscopy
Ankudinov, A. V.
Minarskii, A. M.
TECHNICAL PHYSICS, 2021, 66 (07) : 835 - 850

← 1 2 3 4 5 →