Measurement of the profile and the dihedral angle of grain boundary grooves by atomic force microscopy

被引：0
|
作者：
Schöllhammer, J
Chang, LS
Rabkin, E
Baretzky, B
Gust, W
Mittemeijer, EJ
机构：
[1] Max Planck Inst Met Res, Inst Met, D-70174 Stuttgart, Germany
[2] Univ Stuttgart, Inst Phys Met, D-7000 Stuttgart, Germany
[3] Technion Israel Inst Technol, Dept Mat Engn, IL-32000 Haifa, Israel
来源：
ZEITSCHRIFT FUR METALLKUNDE | 1999年 / 90卷 / 09期
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D O I：
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中图分类号：
TF [冶金工业];
学科分类号：
0806 ;
摘要：
Grain boundary grooves of pure Cu and Cu-50 at.ppm Bi bicrystals were measured by means of atomic force microscopy. An unprecedented accuracy was attained with this method. An analytical function proposed by Mullins for the grooving process was fitted to the measured groove profile. Extrapolation of this fitted function in the groove root of the profile led to accurate values of the dihedral angle.
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页码：687 / 690
页数：4
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