Measurement of the profile and the dihedral angle of grain boundary grooves by atomic force microscopy

被引：0
|
作者：
Schöllhammer, J
Chang, LS
Rabkin, E
Baretzky, B
Gust, W
Mittemeijer, EJ
机构：
[1] Max Planck Inst Met Res, Inst Met, D-70174 Stuttgart, Germany
[2] Univ Stuttgart, Inst Phys Met, D-7000 Stuttgart, Germany
[3] Technion Israel Inst Technol, Dept Mat Engn, IL-32000 Haifa, Israel
来源：
ZEITSCHRIFT FUR METALLKUNDE | 1999年 / 90卷 / 09期
关键词：
D O I：
暂无
中图分类号：
TF [冶金工业];
学科分类号：
0806 ;
摘要：
Grain boundary grooves of pure Cu and Cu-50 at.ppm Bi bicrystals were measured by means of atomic force microscopy. An unprecedented accuracy was attained with this method. An analytical function proposed by Mullins for the grooving process was fitted to the measured groove profile. Extrapolation of this fitted function in the groove root of the profile led to accurate values of the dihedral angle.
引用
收藏
页码：687 / 690
页数：4
相关论文
共 50 条
  • [41] Quantitative Measurements of Grain Boundary Sliding in an Ultrafine-Grained Al Alloy by Atomic Force Microscopy
    Jung H. Han
    Farghalli A. Mohamed
    [J]. Metallurgical and Materials Transactions A, 2011, 42 : 3969 - 3978
  • [42] Atomic force microscopy images of a pollen grain: A preliminary study
    Demanet, CM
    Sankar, KV
    [J]. SOUTH AFRICAN JOURNAL OF BOTANY, 1996, 62 (04) : 221 - 223
  • [43] In situ atomic force microscopy of the electrochemical dissolution of a copper grain
    Chan, HSO
    Ho, PKH
    Zhou, L
    Luo, N
    Ng, SC
    Li, SFY
    [J]. LANGMUIR, 1996, 12 (10) : 2580 - 2586
  • [44] Interrogation of alumina grain boundaries using atomic force microscopy
    Tibble, PA
    Heywood, BR
    Richardson, R
    Barnes, P
    [J]. NUCLEATION AND GROWTH PROCESSES IN MATERIALS, 2000, 580 : 207 - 212
  • [45] Quantitative impedance measurement using atomic force microscopy
    O'Hayre, R
    Feng, G
    Nix, WD
    Prinz, FB
    [J]. JOURNAL OF APPLIED PHYSICS, 2004, 96 (06) : 3540 - 3549
  • [46] A Compressed Sensing Measurement Matrix For Atomic Force Microscopy
    Maxwell, Brian D.
    Andersson, Sean B.
    [J]. 2014 AMERICAN CONTROL CONFERENCE (ACC), 2014,
  • [47] Motility Measurement of a Mouse Sperm by Atomic Force Microscopy
    Hsiao, Wesley W.
    Liao, Hsien-Shun
    Lin, Hsing-Hung
    Ding, Ren-Feng
    Huang, Kuang-Yuh
    Chang, Chia-Seng
    [J]. ANALYTICAL SCIENCES, 2013, 29 (01) : 3 - 8
  • [48] Measurement of microoptical components using atomic force microscopy
    Haselbeck, S
    Schwider, J
    [J]. TECHNISCHES MESSEN, 1996, 63 (05): : 191 - 193
  • [49] Motility Measurement of a Mouse Sperm by Atomic Force Microscopy
    Wesley W. Hsiao
    Hsien-Shun Liao
    Hsing-Hung Lin
    Ren-Feng Ding
    Kuang-Yuh Huang
    Chia-Seng Chang
    [J]. Analytical Sciences, 2013, 29 : 3 - 8
  • [50] Vibration measurement by Atomic Force Microscopy with Laser Readout
    Snitka, V
    Mizariene, V
    Kalinauskas, M
    Lucinskas, P
    [J]. THIRD INTERNATIONAL CONFERENCE ON VIBRATION MEASUREMENTS BY LASER TECHNIQUES: ADVANCES AND APPLICATIONS, 1998, 3411 : 635 - 639
12345