MONTE CARLO SIMULATION OF THE PHOTOELECTRON CROSSTALK IN SILICON IMAGING DEVICES.

被引：0

作者：

Lavine, James P. ^{[1
]}

Chang, Win-Chyi ^{[1
]}

Anagnostopoulos, Constantine N. ^{[1
]}

Burkey, Bruce C. ^{[1
]}

Nelson, Edward T. ^{[1
]}

机构：

[1] Eastman Kodak Co, Rochester, NY, USA, Eastman Kodak Co, Rochester, NY, USA

来源：

| 1600年 / CAD-4期

关键词：

MATHEMATICAL STATISTICS - Monte Carlo Methods - SIGNAL INTERFERENCE - Crosstalk - SOLID STATE DEVICES;

D O I：

暂无

中图分类号：

学科分类号：

摘要：

The Monte Carlo method is used to evaluate the extent of crosstalk in solid-state imagers. The calculations are performed in three dimensions and are in excellent agreement with experiment. The Monte Carlo method is used because it handles adjacent regions that either collect or reflect minority carriers. 27 refs.

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