COMPLEMENTARY METAL-OXIDE SEMICONDUCTOR LOGIC TESTABILITY.

被引：0
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作者：
Curtis, H.W.
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来源：
IBM Technical Disclosure Bulletin | 1973年 / 16卷 / 02期
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中图分类号：
TP [自动化技术、计算机技术];
学科分类号：
0812 ;
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页码：404 / 405
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