Properties of substrates for low temperature quantitative microscopy and microanalysis

被引：0
|
作者：
Lamvik, M.K.
Davilla, S.D.
Tuttle, J.
机构：
来源：
Proceedings of the Pfefferkorn Conference | 1600年
关键词：
D O I：
暂无
中图分类号：
学科分类号：
摘要：
引用
收藏
相关论文
共 50 条
  • [31] Study on the Magnetic Properties of Metal Substrates at Low Temperature by Fabricated Compact SST
    Kume, Kazuki
    Inoue, Ryota
    Ueda, Hiroshi
    Kim, SeokBeom
    IEEE TRANSACTIONS ON APPLIED SUPERCONDUCTIVITY, 2022, 32 (06)
  • [32] Structural and optical properties of CdSe films brush plated on low temperature substrates
    Murali, KR
    Elango, P
    Gopalakrishnan, P
    MATERIALS CHEMISTRY AND PHYSICS, 2006, 96 (01) : 103 - 106
  • [33] Low-temperature transport properties of InSb films on GaAS(100) substrates
    Ishida, S
    Takeda, K
    Okamoto, A
    Shibasaki, I
    PHYSICA E-LOW-DIMENSIONAL SYSTEMS & NANOSTRUCTURES, 2003, 18 (1-3): : 159 - 160
  • [34] Quantitative microanalysis under SEM low-vacuum chamber conditions
    Krusemann, JP
    Dijkstra, JM
    ELECTRON MICROSCOPY 1998, VOL 1: GENERAL INTEREST AND INSTRUMENTATION, 1998, : 473 - 474
  • [35] Travel awards for microscopy and microanalysis
    不详
    FOOD AUSTRALIA, 1998, 50 (09): : 424 - 424
  • [36] EXPO: MICROSCOPY AND MICROANALYSIS 2010
    Piston, David
    Vincenzi, Edward
    Hogue, Frauke
    Beniac, Daniel
    MICROSCOPY AND MICROANALYSIS, 2010, 16 : 36 - 36
  • [37] SCATTERED ELECTRONS IN MICROSCOPY AND MICROANALYSIS
    OTTENSMEYER, FP
    SCIENCE, 1982, 215 (4532) : 461 - 466
  • [38] MICROANALYSIS BY REFLECTANCE FTIR MICROSCOPY
    REFFNER, JA
    WIHLBORG, WT
    AMERICAN LABORATORY, 1990, 22 (06) : 26 - &
  • [39] ASTM standards in microscopy and microanalysis
    Friel, JJ
    MICROBEAM ANALYSIS 2000, PROCEEDINGS, 2000, (165): : 399 - 400
  • [40] Interactive Collaboratories for Microscopy and Microanalysis
    Zaluzec, Nestor J.
    Journal of Computer-Assisted Microscopy, 1997, 9 (02): : 93 - 96
12345