Interference monitoring of the refractive index of transparent thin films

被引:0
|
作者
State Inst of Precision Mechanics, and Optics , St. Petersburg, Russia [1 ]
机构
来源
J Opt Technol | / 11卷 / 1073-1074期
关键词
D O I
暂无
中图分类号
学科分类号
摘要
引用
收藏
相关论文
共 50 条
  • [31] DETERMINATION OF REFRACTIVE-INDEX OF THIN-FILMS
    VAINSHTEIN, VM
    TOKAREVA, NV
    INDUSTRIAL LABORATORY, 1971, 37 (06): : 900 - +
  • [32] Measurement of the nonlinear refractive Index in optical thin Films
    Steinecke, M.
    Jupe, M.
    Kiedrowski, K.
    Ristau, D.
    LASER-INDUCED DAMAGE IN OPTICAL MATERIALS 2017, 2017, 10447
  • [33] Refractive index of erbium doped GaN thin films
    Alajlouni, S.
    Sun, Z. Y.
    Li, J.
    Zavada, J. M.
    Lin, J. Y.
    Jiang, H. X.
    APPLIED PHYSICS LETTERS, 2014, 105 (08)
  • [34] Measuring the refractive index of thin liquid films with a spectrometer
    Greco, Vincenzo
    Hoffer, Lois
    Molesini, Giuseppe
    Applied Optics, 2001, 40 (28): : 5111 - 5113
  • [35] Study of refractive index of PS thin films.
    Hu, X
    Shin, K
    Rafailovich, M
    Sokolov, J
    Stein, R
    Chan, Y
    Kolb, R
    ABSTRACTS OF PAPERS OF THE AMERICAN CHEMICAL SOCIETY, 1999, 218 : U615 - U615
  • [36] Hard Transparent Titania/Silicone Thin Coatings with Tunable Refractive Index
    Wang Fang
    Zhao Xue
    Xu Yanghai
    Liu Bo
    Luo Zhongkuan
    RARE METAL MATERIALS AND ENGINEERING, 2012, 41 : 262 - 265
  • [37] Influence of Refractive Index on Antireflectance Efficiency of Thin Films
    Khan, Sadaf Bashir
    Irfan, Syed
    Zheng Zhuanghao
    Lee, Shern Long
    MATERIALS, 2019, 12 (09)
  • [38] Wavelength and temperature dispersion of refractive index of thin films
    Wood, Thomas M.
    Le Rouzo, Judikael
    Flory, Francois R.
    Escoubas, Ludovic
    Coudray, Paul
    OPTICAL COMPLEX SYSTEMS: OCS11, 2011, 8172
  • [39] Ellipsometry for determining the refractive index profiles of thin films
    Tolmachev, VA
    POLARIMETRY AND ELLIPSOMETRY, 1997, 3094 : 281 - 287
  • [40] Extraction of the refractive index profile of thin transparent conductive oxide films from the analysis of reflectance optical spectra
    Kondilis, A.
    Aperathitis, E.
    Modreanu, M.
    THIN SOLID FILMS, 2007, 515 (24) : 8586 - 8589