Interference monitoring of the refractive index of transparent thin films

被引：0
|
作者：
State Inst of Precision Mechanics, and Optics , St. Petersburg, Russia [1 ]
机构：
来源：
J Opt Technol | / 11卷 / 1073-1074期
关键词：
D O I：
暂无
中图分类号：
学科分类号：
摘要：
引用
收藏
相关论文
共 50 条
  • [21] INSTRUMENT FOR DETERMINATION OF REFRACTIVE INDEX OF THIN FILMS
    VETURY, R
    RAMANUJAM, R
    INDIAN JOURNAL OF PURE & APPLIED PHYSICS, 1969, 7 (04) : 236 - +
  • [22] REFRACTIVE INDEX OF THIN MONOCRYSTAL FILMS OF INSE
    CELUSTKA, B
    PERSIN, A
    BIDJIN, D
    JOURNAL OF APPLIED PHYSICS, 1970, 41 (02) : 813 - &
  • [23] Determination of refractive index of CIS thin films
    Senthil, K
    Nataraj, D
    Prabakar, K
    Mangalraj, D
    Narayandass, SK
    Udhayakumar, N
    Krishnakumar, N
    BULLETIN OF ELECTROCHEMISTRY, 1998, 14 (11): : 387 - 390
  • [24] Measuring Refractive Index of Transparent Plate by Low-Coherent Interference
    Gao Bo
    Li Qiang
    Liu Ang
    Chai Liqun
    CHINESE JOURNAL OF LASERS-ZHONGGUO JIGUANG, 2019, 46 (08):
  • [25] Novel transparent Mg-Si-O-N thin films with high hardness and refractive index
    Ali, Sharafat
    Paul, Biplab
    Magnusson, Roger
    Greczynski, Grzegorz
    Broitman, Esteban
    Jonson, Bo
    Eklund, Per
    Birch, Jens
    VACUUM, 2016, 131 : 1 - 4
  • [26] DETERMINATION OF THICKNESS AND REFRACTIVE-INDEX OF THIN TRANSPARENT MULTILAYER FILMS ON SILICON FROM ELLIPSOMETRIC DATA
    DOHERTY, JG
    RYAN, WD
    PROCEEDINGS OF THE INSTITUTION OF ELECTRICAL ENGINEERS-LONDON, 1975, 122 (10): : 1093 - 1094
  • [27] DETERMINATION OF REFRACTIVE-INDEX OF THIN-FILMS FROM INTERFERENCE-FRINGE REFLECTION SPECTRA
    JAEGER, JB
    JUNGLING, KC
    FENTER, JR
    JOHNSTON, GT
    BULLETIN OF THE AMERICAN PHYSICAL SOCIETY, 1974, 19 (08): : 821 - 821
  • [28] REFRACTIVE-INDEX DETERMINATION OF THIN-FILMS BY TRANSMISSION NOMARSKI DIFFERENTIAL INTERFERENCE CONTRAST MICROSCOPY
    HOLIK, AS
    TAYLOR, DF
    MICROSCOPE, 1977, 25 (04): : 265 - 271
  • [29] Measurement of refractive index and thickness of transparent plate by dual-wavelength interference
    Choi, Hee Joo
    Lim, Hwan Hong
    Moon, Han Seb
    Eom, Tae Bong
    Ju, Jung Jin
    Cha, Myoungsik
    OPTICS EXPRESS, 2010, 18 (09): : 9429 - 9434
  • [30] Measuring the refractive index of thin liquid films with a spectrometer
    Greco, V
    Hoffer, L
    Molesini, G
    APPLIED OPTICS, 2001, 40 (28) : 5111 - 5113
12345