XPS and AES studies of ITO thin films

被引：0
|
作者：
机构：
来源：
Cailiao Yanjiu Xuebao/Chinese Journal of Materials Research | 2000年 / 14卷 / 02期
关键词：
D O I：
暂无
中图分类号：
学科分类号：
摘要：
Semiconducting films
引用
收藏
页码：173 / 178
相关论文
共 50 条
  • [31] X-ray photoelectron spectroscopy studies of ITO thin films
    Chen, M
    Pei, ZL
    Bai, XD
    Huang, RF
    Wen, LS
    JOURNAL OF INORGANIC MATERIALS, 2000, 15 (01) : 188 - 192
  • [32] SEM and XPS studies of titanium dioxide thin films grown by MOCVD
    Babelon, P
    Dequiedt, AS
    Mostefa-Sba, H
    Bourgeois, S
    Sibillot, P
    Sacilotti, M
    THIN SOLID FILMS, 1998, 322 (1-2) : 63 - 67
  • [33] XPS STUDIES OF THE STABILITY AND REACTIVITY OF THIN-FILMS OF OXIDIZED ZIRCONIUM
    WANG, YM
    LI, YS
    WONG, PC
    MITCHELL, KAR
    APPLIED SURFACE SCIENCE, 1993, 72 (03) : 237 - 244
  • [34] XPS and FTIR Studies of Polytetrafluoroethylene Thin Films Obtained by Physical Methods
    Piwowarczyk, Joanna
    Jedrzejewski, Roman
    Moszynski, Dariusz
    Kwiatkowski, Konrad
    Niemczyk, Agata
    Baranowska, Jolanta
    POLYMERS, 2019, 11 (10)
  • [35] XPS and AES
    Asami, K
    DENKI KAGAKU, 1997, 65 (10): : 820 - 825
  • [36] XPS AND AES STUDIES ON THE OXIDATION OF LAYERED SEMICONDUCTOR GASE
    IWAKURO, H
    TATSUYAMA, C
    ICHIMURA, S
    JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 1982, 21 (01): : 94 - 99
  • [37] XPS, AES AND EELS STUDIES OF CR CLUSTERS ON GRAPHITE
    LOZZI, L
    PASSACANTANDO, M
    PICOZZI, P
    SANTUCCI, S
    DECRESCENZI, M
    ZEITSCHRIFT FUR PHYSIK D-ATOMS MOLECULES AND CLUSTERS, 1993, 26 : S51 - S53
  • [38] XPS AND AES STUDIES OF HALOFLUOROCARBON PLASMA ETCHED SURFACES
    OCCHIELLO, E
    GARBASSI, F
    SURFACE AND INTERFACE ANALYSIS, 1988, 12 (1-12) : 288 - 292
  • [39] XPS, AES AND RAMAN STUDIES OF AN ANTITARNISH FILM ON TIN
    FANG, JL
    WU, NJ
    WANG, ZW
    LI, Y
    CORROSION, 1991, 47 (03) : 169 - 173
  • [40] QUANTITATIVE AES AND XPS INVESTIGATION OF MAGNETRON SPUTTERED TINX FILMS
    BENDER, H
    PORTILLO, J
    VANDERVORST, W
    SURFACE AND INTERFACE ANALYSIS, 1989, 14 (6-7) : 337 - 346
12345