Live X-ray topography and crystal growth of silicon

被引：0
|
作者：
Chikawa, Jun-Ichi [1 ]
机构：
[1] Center for Advanced Science and Technology, Kamigori, Ako, Hyogo, 678-1205, Japan
来源：
Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers | 1999年 / 38卷 / 08期
关键词：
Crystal defects - Crystal growth - Crystals - Dislocations (crystals) - Optical resolving power - Phase equilibria - Phase interfaces - Photoconductivity - Surface topography - Synchrotron radiation - Video cameras - X ray analysis;
D O I：
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中图分类号：
学科分类号：
摘要：
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页码：4619 / 4631
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