Trends in component reliability and testing

被引：0

作者：

Zhang, Yibin ^{[1
]}

Das, Diganta ^{[1
]}

Katz, Asaf ^{[1
]}

Pecht, Michael ^{[1
]}

Hallberg, Orjan ^{[1
]}

机构：

[1] Univ of Maryland, College Park, United States

来源：

Semiconductor International | 1999年 / 22卷 / 10期

关键词：

D O I：

暂无

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学科分类号：

摘要：

引用

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