Trends in component reliability and testing

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作者：
Zhang, Yibin [1 ]
Das, Diganta [1 ]
Katz, Asaf [1 ]
Pecht, Michael [1 ]
Hallberg, Orjan [1 ]
机构：
[1] Univ of Maryland, College Park, United States
来源：
Semiconductor International | 1999年 / 22卷 / 10期
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