共 25 条
- [21] Hot carrier reliability of high-speed SiGe HBT's under accelerated collector-base avalanche bias 2008 7TH INTERNATIONAL CARIBBEAN CONFERENCE ON DEVICES, CIRCUITS AND SYSTEMS, 2008, : 325 - 331
- [23] NASDAC - A new simulation tool for the electro-thermal analysis of bipolar devices: Application to multi-finger AlGaAs/GaAs HBT's 2002 23RD INTERNATIONAL CONFERENCE ON MICROELECTRONICS, VOLS 1 AND 2, PROCEEDINGS, 2002, : 455 - 458
- [25] InGaP/GaAs HBT's with high-speed and low-current operation fabricated using WSi/Ti as the base electrode and burying SiO2 in the extrinsic collector INTERNATIONAL ELECTRON DEVICES MEETING - 1997, TECHNICAL DIGEST, 1997, : 739 - 742