NASDAC - A new simulation tool for the electro-thermal analysis of bipolar devices: Application to multi-finger AlGaAs/GaAs HBT's

被引:0
|
作者
Macchiaroli, M [1 ]
d'Alessandro, V [1 ]
Rinaldi, N [1 ]
机构
[1] Univ Naples Federico II, Dept Elect & Telecommun Engn, I-80125 Naples, Italy
来源
2002 23RD INTERNATIONAL CONFERENCE ON MICROELECTRONICS, VOLS 1 AND 2, PROCEEDINGS | 2002年
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中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
In this paper a new simulation tool is presented, suitable to describe the electro-thermal behavior in multi-finger AlGaAs/GaAs devices. The program is based on a new analytical formulation to compute the device temperature distribution both for the steady-state and the transient case and incorporates an accurate electro-thermal physically-based model for the elementary transistor. The effect of the geometry of heat dissipating regions is accounted for. Thermal conductivity dependence on temperature and de-biasing effects across metallization layers are also included. Hence the simulator can be efficaciously used to enhance the thermal chip design, by means of illustrative comparisons between different structures.
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页码:455 / 458
页数:4
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