Temperature dependence of the current conduction mechanisms in ferroelectric Pb(Zr0.53,Ti0.47)O3 thin films

被引：0
|
作者：
Juan, Trevor Pi-Chun [1 ]
Chen, Si-Min [1 ]
Lee, Joseph Ya-Min [1 ]
机构：
[1] Department of Electrical Engineering, Institute of Electronic Engineering, Tsing-Hua University, Hsinchu, Taiwan
来源：
Journal of Applied Physics | 2004年 / 95卷 / 06期
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摘要：
29
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页码：3120 / 3125
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