共 50 条
- [43] SPONTANEOUS SWITCHING OF P-N-P-N DEVICES RADIO ENGINEERING AND ELECTRONIC PHYSICS-USSR, 1967, 12 (04): : 618 - +
- [44] A test structure to verify the robustness of silicided N+/P+ interface ICMTS 2004: PROCEEDINGS OF THE 2004 INTERNATIONAL CONFERENCE ON MICROELECTRONIC TEST STRUCTURES, 2004, : 169 - 172
- [49] New n+-GaAs/δ(P+)-GaInP/n-GaAs camel-gate HFET with high breakdown voltage and low leakage current PROCEEDINGS OF THE SYMPOSIUM ON LIGHT EMITTING DEVICES FOR OPTOELECTRONIC APPLICATIONS AND THE TWENTY-EIGHTH STATE-OF-THE-ART PROGRAM ON COMPOUND SEMICONDUCTORS, 1998, 98 (02): : 455 - 460