ACCELERATED LIFE TEST AND ANALYSIS OF CHARACTERISTIC DEGRADATION OF TANTALUM SOLID ELECTROLYTIC CAPACITORS.

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作者：
HARADA, TOMOSHICHI
SHIOMI, HIROSHI
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| 1981年 / V 45卷 / N 5-6期
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摘要：
ACCELERATED LIFE TEST DATA ON TANTALUM ELECTROLYTIC CAPACITORS ARE ANALYZED AND THE RESULTS OBTAINED ARE SUMMARIZED. THE SAMPLES (N = APPROXIMATELY 15-20) OF TWO DIFFERENT MANUFACTURERS A AND B ARE TESTED DURING 2 * 10**4 HOURS AT COMBINEDCONDITIONS OF 5 DIFFERENT AMBIENT TEMPERATURES (25, 55, 85,100 AND 125 D. C) AND 2 LEVELS OF APPLIED VOLTAGE (RATED AND 2 TIMES RATED VOLTAGE). THE DEGRADATION PATTERN OF CHARACTERISTIC PARAMETER X, AND THE CUMULATIVE DISTRIBUTION OF THE DEGRADATION LIFE TIME, WHICH IS DEFINED AS THE DURATION OF TIME WHEN X REACHES TO THE SPECIFIED VALUE, ARE GIVEN. IN JAPANESE WITH ENGLISH ABSTRACT.
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页码：275 / 310
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