Failure analysis of metallized film pulse capacitors based on accelerated degradation data

被引：0
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作者：
Zhao, Jian-Yin [1 ]
Sun, Quan [1 ]
Zhou, Jing-Lun [1 ]
He, Shao-Bo [2 ]
Wei, Xiao-Feng [2 ]
机构：
[1] School of Information System and Management, National University of Defense Technology, Changsha 410073, China
[2] Research Center of Laser Fusion, China Academy of Engineering Physics, P.O. Box 919-988, Mianyang 621900, China
来源：
Qiangjiguang Yu Lizishu/High Power Laser and Particle Beams | 2006年 / 18卷 / 09期
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页码：1495 / 1498
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