Optical metrology for MR heads

被引:0
|
作者
Seagate Technology, Minneapolis, United States [1 ]
机构
来源
IEEE Trans Magn | / 5 pt 1卷 / 2926-2928期
关键词
D O I
暂无
中图分类号
学科分类号
摘要
引用
收藏
相关论文
共 50 条
  • [21] Optical microsystems metrology
    Osten, W
    OPTICS AND LASERS IN ENGINEERING, 2001, 36 (02) : 75 - 76
  • [22] Optical metrology in China
    Zhao, B
    Zhang, GJ
    OPTICS AND LASERS IN ENGINEERING, 2005, 43 (10) : 1037 - 1038
  • [23] Optical and mechanical metrology
    Wilkening, G
    RECENT ADVANCES IN METROLOGY AND FUNDAMENTAL CONSTANTS, 2001, 146 : 495 - 518
  • [24] Optical fiber metrology
    Day, Gordon W.
    Franzen, Douglas L.
    JOURNAL OF LIGHTWAVE TECHNOLOGY, 2008, 26 (9-12) : 1119 - 1131
  • [25] Fuzzy optical metrology
    Alabama A&M Univ, Normal, United States
    IEEE Trans Fuzzy Syst, 2 (206-208):
  • [26] Quantum optical metrology
    Alodjants, A.P.
    Tsarev, D.V.
    Kuts, D.A.
    Podoshvedov, S.A.
    Kulik, S.P.
    Physics-Uspekhi, 2024, 67 (07) : 668 - 693
  • [27] Fuzzy optical metrology
    Caulfield, HJ
    IEEE TRANSACTIONS ON FUZZY SYSTEMS, 1996, 4 (02) : 206 - 208
  • [28] The GRAVITY metrology system: modeling a metrology in optical fibers
    Blind, N.
    Huber, H.
    Eisenhauer, F.
    Weber, J.
    Gillessen, S.
    Lippa, M.
    Burtscher, L.
    Hans, O.
    Haug, M.
    Haussmann, F.
    Huber, S.
    Janssen, A.
    Kellner, S.
    Kok, Y.
    Ott, T.
    Pfuhl, O.
    Sturm, E.
    Wieprecht, E.
    Amorim, A.
    Brandner, W.
    Perrin, G.
    Perraut, K.
    Straubmeier, C.
    OPTICAL AND INFRARED INTERFEROMETRY IV, 2014, 9146
  • [29] Alternate pole materials for MR tape heads
    Jursich, M
    Rook, K
    Henderson, M
    Liu, D
    IEEE TRANSACTIONS ON MAGNETICS, 1996, 32 (01) : 156 - 159
  • [30] Alternate pole materials for MR tape heads
    Seagate Technology, Minneapolis, United States
    IEEE Trans Magn, 1 (156-159):