AUTOMATING INNERLAYER INSPECTION.

被引：0
|
作者：
Ragland, John [1 ]
机构：
[1] Automated Systems Inc, Brookfield,, WI, USA, Automated Systems Inc, Brookfield, WI, USA
来源：
Circuits Manufacturing | 1985年 / 25卷 / 02期
关键词：
PATTERN RECOGNITION;
D O I：
暂无
中图分类号：
学科分类号：
摘要：
Inspection speed and efficiency are increased by the introduction of automatic optical inspection (AOI) that examines the inner layers and improves the ability to detect defects. A look is given at the advantages and disadvantages of each of the two broad categories of AOI equipment: design rule checking (DRC) and pattern recognition (PR). Both systems are described and compared.
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页码：91 / 92
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