AUTOMATING INNERLAYER INSPECTION.

被引：0

作者：

Ragland, John ^{[1
]}

机构：

[1] Automated Systems Inc, Brookfield,, WI, USA, Automated Systems Inc, Brookfield, WI, USA

来源：

Circuits Manufacturing | 1985年 / 25卷 / 02期

关键词：

PATTERN RECOGNITION;

D O I：

暂无

中图分类号：

学科分类号：

摘要：

Inspection speed and efficiency are increased by the introduction of automatic optical inspection (AOI) that examines the inner layers and improves the ability to detect defects. A look is given at the advantages and disadvantages of each of the two broad categories of AOI equipment: design rule checking (DRC) and pattern recognition (PR). Both systems are described and compared.

引用

页码：91 / 92

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