Kinetic analysis of the C49-to-C54 phase transformation in TiSi2 thin films by in situ observation

被引:0
|
作者
Tanaka, H. [1 ]
Hirashita, N. [1 ]
Sinclair, R. [1 ]
机构
[1] Oki Electric Industry Co Ltd, Tokyo, Japan
关键词
D O I
暂无
中图分类号
学科分类号
摘要
引用
收藏
页码:4284 / 4287
相关论文
共 50 条
  • [31] Suppression of the phase transition to C54 TiSi2 due to epitaxial growth of C49 TiSi2 on Si(001) substrates in silicidation process
    Komiya, Satoshi
    Tomita, Hirofumi
    Ikeda, Kazuto
    Horii, Yoshimasa
    Nakamura, Tomoji
    Japanese Journal of Applied Physics, Part 1: Regular Papers & Short Notes & Review Papers, 1996, 35 (1 A): : 242 - 246
  • [32] Investigation of C49-C54TiSi2 transformation kinetics
    Ottaviani, G
    Tonini, R
    Giubertoni, D
    Sabbadini, A
    Marangon, T
    Queirolo, G
    La Via, F
    MICROELECTRONIC ENGINEERING, 2000, 50 (1-4) : 153 - 158
  • [33] Suppression of the phase transition to C54 TiSi2 due to epitaxial growth of C49 TiSi2 on Si(001) substrates in silicidation process
    Komiya, S
    Tomita, H
    Ikeda, K
    Horii, Y
    Nakamura, T
    JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 1996, 35 (1A): : 242 - 246
  • [34] Small area versus narrow line width effects on the C49 to C54 transformation of TiSi2
    DiGregorio, JE
    Wall, RN
    IEEE TRANSACTIONS ON ELECTRON DEVICES, 2000, 47 (02) : 313 - 317
  • [35] Direct measurement of the growth rate during the C49 to C54 transformation in TiSi2: Activation energy
    Privitera, S.
    La Via, F.
    Quilici, S.
    Meinardi, F.
    Grimaldi, M.G.
    Rimini, E.
    Journal of Applied Physics, 2002, 92 (01): : 627 - 628
  • [36] Direct measurement of the growth rate during the C49 to C54 transformation in TiSi2:: Activation energy
    Privitera, S
    La Via, F
    Quilici, S
    Meinardi, F
    Grimaldi, MG
    Rimini, E
    JOURNAL OF APPLIED PHYSICS, 2002, 92 (01) : 627 - 628
  • [37] KINETIC MECHANISMS OF THE C49-TO-C54 POLYMORPHIC TRANSFORMATION IN TITANIUM DISILICIDE THIN-FILMS - A MICROSTRUCTURE-SCALED NUCLEATION-MODE TRANSITION
    MA, Z
    ALLEN, LH
    PHYSICAL REVIEW B, 1994, 49 (19): : 13501 - 13511
  • [38] Structural study of refractory-metal-free C40 TiSi2 and its transformation to C54 TiSi2
    Yu, T
    Tan, SC
    Shen, ZX
    Chen, LW
    Lin, JY
    See, AK
    APPLIED PHYSICS LETTERS, 2002, 80 (13) : 2266 - 2268
  • [39] Ion-induced amorphization and regrowth of C49 and C54 TiSi2
    Mohadjeri, B
    Maex, K
    Donaton, RA
    Bender, H
    JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1999, 146 (03) : 1122 - 1129
  • [40] Doping influence on TiSi2 C49-C54 phase conversion kinetics by micro-Raman spectroscopy
    Meinardi, F
    Quilici, S
    Moro, L
    Queirolo, G
    Sabbadini, A
    ADVANCED INTERCONNECTS AND CONTACT MATERIALS AND PROCESSES FOR FUTURE INTEGRATED CIRCUITS, 1998, 514 : 387 - 392