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- [2] In situ observation of the C49-to-C54 phase transformation in TiSi2 thin films by transmission electron microscopy JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS, 1996, 35 (4B): : L479 - L481
- [4] Si-surface amorphization effects for C49-to-C54 phase transformation in TiSi2 film STRESS INDUCED PHENOMENA IN METALLIZATION - FOURTH INTERNATIONAL WORKSHOP, 1998, (418): : 463 - 468
- [7] Structure, morphology and kinetics of the C49 to C54 phase transformation in TiSi2 thin films PHASE TRANSFORMATIONS AND SYSTEMS DRIVEN FAR FROM EQUILIBRIUM, 1998, 481 : 593 - 598
- [10] C49-TiSi2 epitaxial orientation dependence of the C49-to-C54 phase transformation rate ADVANCED INTERCONNECTS AND CONTACT MATERIALS AND PROCESSES FOR FUTURE INTEGRATED CIRCUITS, 1998, 514 : 213 - 218