Measurement of glass-bonded GaAs/GaAlAs photocathode by X-ray double crystal diffractometry

被引：0
|
作者：
Yan, Jinliang
Xiang, Shiming
机构：
来源：
Hongwai Jishu/Infrared Technology | / 20卷 / 02期
关键词：
D O I：
暂无
中图分类号：
学科分类号：
摘要：
引用
收藏
页码：33 / 37
相关论文
共 50 条
  • [21] Structural characteristics of multicomponent GaAs-InxGa1-xAs system from double-crystal X-ray diffractometry data
    A. M. Afanas’ev
    M. A. Chuev
    R. M. Imamov
    A. A. Lomov
    Crystallography Reports, 2000, 45 : 655 - 660
  • [22] Study of multilayer GaAs-InxGa1-xAs layer-based structure by double-crystal X-ray diffractometry
    Afanasev, AM
    Chuev, MA
    Imamov, RM
    Lomov, AA
    Mokerov, VG
    Fedorov, YV
    Guk, AV
    CRYSTALLOGRAPHY REPORTS, 1997, 42 (03) : 467 - 476
  • [23] Ultra high angle double-crystal X-ray diffractometry (U-HADOX)
    Okazaki, A
    Munakata, K
    APPLIED CRYSTALLIGRAPHY, 2004, : 10 - 15
  • [24] Analysis of synthetic diamond single crystals by X-ray topography and double-crystal diffractometry
    Prokhorov, I. A.
    Ralchenko, V. G.
    Bolshakov, A. P.
    Polskiy, A. V.
    Vlasov, A. V.
    Subbotin, I. A.
    Podurets, K. M.
    Pashaev, E. M.
    Sozontov, E. A.
    CRYSTALLOGRAPHY REPORTS, 2013, 58 (07) : 1010 - 1016
  • [25] Analysis of synthetic diamond single crystals by X-ray topography and double-crystal diffractometry
    I. A. Prokhorov
    V. G. Ralchenko
    A. P. Bolshakov
    A. V. Polskiy
    A. V. Vlasov
    I. A. Subbotin
    K. M. Podurets
    E. M. Pashaev
    E. A. Sozontov
    Crystallography Reports, 2013, 58 : 1010 - 1016
  • [26] FRACTURE STUDIES IN SILICON CRYSTALS BY X-RAY PENDELLOSUNG FRINGES AND DOUBLE-CRYSTAL DIFFRACTOMETRY
    WEISSMANN, S
    TSUNEKAWA, Y
    KANNAN, VC
    METALLURGICAL TRANSACTIONS, 1973, 4 (01): : 376 - 377
  • [27] Double-Crystal X-Ray Diffractometry and Topography Methods in the Analysis of the Real Structure of Crystals
    Romanov, D. A.
    Prokhorov, I. A.
    Voloshin, A. E.
    Kosushkin, V. G.
    Bolshakov, A. P.
    Ralchenko, V. G.
    JOURNAL OF SURFACE INVESTIGATION, 2020, 14 (06): : 1113 - 1120
  • [28] LPE HIGHLY PERFECT INGAASP INP STRUCTURE CHARACTERIZATION BY X-RAY DOUBLE CRYSTAL DIFFRACTOMETRY
    BOCCHI, C
    FERRARI, C
    FRANZOSI, P
    FORNUTO, G
    PELLEGRINO, S
    TAIARIOL, F
    JOURNAL OF ELECTRONIC MATERIALS, 1987, 16 (04) : 245 - 250
  • [29] Structural characterization of quantum-well layers by double-crystal X-ray diffractometry
    Afanas'ev, AM
    Imamov, RM
    CRYSTALLOGRAPHY REPORTS, 2003, 48 (05) : 728 - 743
  • [30] Double-Crystal X-Ray Diffractometry and Topography Methods in the Analysis of the Real Structure of Crystals
    D. A. Romanov
    I. A. Prokhorov
    A. E. Voloshin
    V. G. Kosushkin
    A. P. Bolshakov
    V. G. Ralchenko
    Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques, 2020, 14 : 1113 - 1120
12345