FRACTURE STUDIES IN SILICON CRYSTALS BY X-RAY PENDELLOSUNG FRINGES AND DOUBLE-CRYSTAL DIFFRACTOMETRY

被引：6
|
作者：
WEISSMANN, S [1 ]
TSUNEKAWA, Y [1 ]
KANNAN, VC [1 ]
机构：
[1] RUTGERS STATE UNIV, COLL ENGN, DEPT MECH & MAT SCI, NEW BRUNSWICK, NJ 08903 USA
来源：
METALLURGICAL TRANSACTIONS | 1973年 / 4卷 / 01期
关键词：
D O I：
10.1007/BF02649645
中图分类号：
TF [冶金工业];
学科分类号：
0806 ;
摘要：
引用
收藏
页码：376 / 377
页数：2
相关论文
共 50 条
  • [1] Double-crystal x-ray diffractometry of single crystals with microdefects
    Molodkin, VB
    Olikhovskii, SI
    Kislovskii, EN
    Krivitsky, VP
    Len, EG
    Pervak, EV
    Ice, GE
    Larson, BC
    [J]. JOURNAL OF PHYSICS D-APPLIED PHYSICS, 2001, 34 (10A) : A82 - A86
  • [2] CHARACTERIZATION OF POROUS SILICON LAYERS BY MEANS OF X-RAY DOUBLE-CRYSTAL DIFFRACTOMETRY
    SUGIYAMA, H
    NITTONO, O
    [J]. ISIJ INTERNATIONAL, 1989, 29 (03) : 223 - 228
  • [3] Analysis of synthetic diamond single crystals by X-ray topography and double-crystal diffractometry
    Prokhorov, I. A.
    Ralchenko, V. G.
    Bolshakov, A. P.
    Polskiy, A. V.
    Vlasov, A. V.
    Subbotin, I. A.
    Podurets, K. M.
    Pashaev, E. M.
    Sozontov, E. A.
    [J]. CRYSTALLOGRAPHY REPORTS, 2013, 58 (07) : 1010 - 1016
  • [4] Double-Crystal X-Ray Diffractometry and Topography Methods in the Analysis of the Real Structure of Crystals
    Romanov, D. A.
    Prokhorov, I. A.
    Voloshin, A. E.
    Kosushkin, V. G.
    Bolshakov, A. P.
    Ralchenko, V. G.
    [J]. JOURNAL OF SURFACE INVESTIGATION, 2020, 14 (06): : 1113 - 1120
  • [5] Analysis of synthetic diamond single crystals by X-ray topography and double-crystal diffractometry
    I. A. Prokhorov
    V. G. Ralchenko
    A. P. Bolshakov
    A. V. Polskiy
    A. V. Vlasov
    I. A. Subbotin
    K. M. Podurets
    E. M. Pashaev
    E. A. Sozontov
    [J]. Crystallography Reports, 2013, 58 : 1010 - 1016
  • [6] Double-Crystal X-Ray Diffractometry and Topography Methods in the Analysis of the Real Structure of Crystals
    D. A. Romanov
    I. A. Prokhorov
    A. E. Voloshin
    V. G. Kosushkin
    A. P. Bolshakov
    V. G. Ralchenko
    [J]. Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques, 2020, 14 : 1113 - 1120
  • [7] CRACK-PROPAGATION IN SILICON CRYSTALS DISCLOSED BY X-RAY PENDELLOSUNG FRINGES
    WEISSMAN.S
    TSUNEKAW.Y
    [J]. ACTA CRYSTALLOGRAPHICA A-FOUNDATION AND ADVANCES, 1972, 28 : S162 - S162
  • [8] X-ray double-crystal diffractometry of Verneuil-grown SrTiO3 crystals
    Yoshimura, J
    Sakamoto, T
    Yamanaka, J
    [J]. JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 2001, 40 (11): : 6536 - 6542
  • [9] Double-crystal X-ray diffractometry in the role of X-ray standing-wave method
    Afanas'ev, AM
    Chuev, MA
    Imamov, RM
    Pashaev, ÉM
    Yakunin, SN
    Horvat, J
    [J]. JETP LETTERS, 2001, 74 (10) : 498 - 501
  • [10] Double-crystal X-ray diffractometry in the role of X-ray standing-wave method
    A. M. Afanas’ev
    M. A. Chuev
    R. M. Imamov
    É. M. Pashaev
    S. N. Yakunin
    J. Horvat
    [J]. Journal of Experimental and Theoretical Physics Letters, 2001, 74 : 498 - 501
12345