FRACTURE STUDIES IN SILICON CRYSTALS BY X-RAY PENDELLOSUNG FRINGES AND DOUBLE-CRYSTAL DIFFRACTOMETRY

被引：6

作者：

WEISSMANN, S ^{[1
]}

TSUNEKAWA, Y ^{[1
]}

KANNAN, VC ^{[1
]}

机构：

[1] RUTGERS STATE UNIV, COLL ENGN, DEPT MECH & MAT SCI, NEW BRUNSWICK, NJ 08903 USA

来源：

METALLURGICAL TRANSACTIONS | 1973年 / 4卷 / 01期

关键词：

D O I：

10.1007/BF02649645

中图分类号：

TF [冶金工业];

学科分类号：

0806 ;

摘要：

引用

页码：376 / 377

页数：2

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