Positron lifetime studies on oxygen-doped amorphous silicon films

被引：0
|
作者：
Shi, Zhiqiang [1 ]
Liu, Keyuan [1 ]
Wang, Xueen [1 ]
Liu, Xingsheng [1 ]
Yiang, Ziqiang [1 ]
机构：
[1] Shaanxi Normal Univ, Xi'an, China
来源：
Pan Tao Ti Hsueh Pao/Chinese Journal of Semiconductors | 1997年 / 18卷 / 11期
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页码：811 / 813
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