EFFECT OF ATOMIC FORCE ON THE SURFACE CORRUGATION OF 2H-NbSe2 OBSERVED BY SCANNING TUNNELING MICROSCOPY.

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作者：
Bando, Hiroshi [1 ]
Tokumoto, Hiroshi [1 ]
Mizutani, Wataru [1 ]
Watanabe, Kazutoshi [1 ]
Okano, Makoto [1 ]
Ono, Masatoshi [1 ]
Murakami, Hiroshi [1 ]
Okayama, Shigeo [1 ]
Ono, Yuichi [1 ]
Wakiyama, Shigeru [1 ]
Sakai, Fumiki [1 ]
Endo, Kazuhiro [1 ]
Kajimura, Koji [1 ]
机构：
[1] Electrotechnical Lab, Sakura-mura, Jpn, Electrotechnical Lab, Sakura-mura, Jpn
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| 1600年 / 26期
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