EFFECT OF ATOMIC FORCE ON THE SURFACE CORRUGATION OF 2H-NbSe2 OBSERVED BY SCANNING TUNNELING MICROSCOPY.

被引：0

作者：

Bando, Hiroshi ^{[1
]}

Tokumoto, Hiroshi ^{[1
]}

Mizutani, Wataru ^{[1
]}

Watanabe, Kazutoshi ^{[1
]}

Okano, Makoto ^{[1
]}

Ono, Masatoshi ^{[1
]}

Murakami, Hiroshi ^{[1
]}

Okayama, Shigeo ^{[1
]}

Ono, Yuichi ^{[1
]}

Wakiyama, Shigeru ^{[1
]}

Sakai, Fumiki ^{[1
]}

Endo, Kazuhiro ^{[1
]}

Kajimura, Koji ^{[1
]}

机构：

[1] Electrotechnical Lab, Sakura-mura, Jpn, Electrotechnical Lab, Sakura-mura, Jpn

来源：

| 1600年 / 26期

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