SCAN-TESTABLE 6000 GATE ARRAY.

被引：0

作者：

Berendts, P.A.B. ^{[1
]}

机构：

[1] Philips Elcoma, Nijmegen, Neth, Philips Elcoma, Nijmegen, Neth

来源：

IEEE transactions on industrial electronics and control instrumentation | 1984年 / IE-33卷 / 04期

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摘要：

引用

页码：377 / 387

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