SCAN-TESTABLE 6000 GATE ARRAY.

被引：0
|
作者：
Berendts, P.A.B. [1 ]
机构：
[1] Philips Elcoma, Nijmegen, Neth, Philips Elcoma, Nijmegen, Neth
来源：
IEEE transactions on industrial electronics and control instrumentation | 1984年 / IE-33卷 / 04期
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摘要：
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页码：377 / 387
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