Technology and layout-related testing of static random-access memories

被引：0
|
作者：
Chakraborty, Kanad [1 ]
Mazumder, Pinaki [1 ]
机构：
[1] Univ of Michigan, Ann Arbor, United States
来源：
Journal of Electronic Testing: Theory and Applications (JETTA) | 1994年 / 5卷 / 04期
关键词：
31;
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摘要：
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页码：347 / 365
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