Defects in SiO2/Si structures probed by using a monoenergetic positron beam

被引：0

作者：

Uedono, Akira ^{[1
]}

Wei, Long ^{[1
]}

Tanigawa, Shoichiro ^{[1
]}

Ohji, Yuzuru ^{[1
]}

机构：

[1] Univ of Tsukuba, Ibaraki, Japan

来源：

| 1600年 / JJAP, Minato-ku, Japan卷 / 33期

关键词：

28;

D O I：

暂无

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学科分类号：

摘要：

引用

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