Electromigration behavior of eutectic SnPb solder

被引：0
|
作者：
Choi, Jae-Young [1 ]
Lee, Sang-Su [1 ]
Joo, Young-Chang [1 ]
机构：
[1] Sch. of Mat. Science and Engineering, Seoul National University, Seoul 151-742, Korea, Republic of
来源：
Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers | 2002年 / 41卷 / 12期
关键词：
D O I：
10.1143/jjap.41.7487
中图分类号：
学科分类号：
摘要：
8
引用
收藏
页码：7487 / 7490
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