共 50 条
- [21] Non-Destructive Techniques for Internal Solder Bump Inspection of Chip Scale Package-Ball Grid Array Package 2014 IEEE 21ST INTERNATIONAL SYMPOSIUM ON THE PHYSICAL AND FAILURE ANALYSIS OF INTEGRATED CIRCUITS (IPFA), 2014, : 362 - 365
- [29] Predicted Size of the Inelastic Zone in a Ball-Grid-Array (BGA) Assembly 2013 IEEE AEROSPACE CONFERENCE, 2013,