共 50 条
- [21] CONTACTLESS MEASUREMENT OF CHARGE CARRIER MOBILITY IN SEMICONDUCTORS. Instruments and experimental techniques New York, 1984, 27 (1 pt 2): : 208 - 210
- [22] Contactless measurement of minority carrier lifetime in silicon ingots and bricks PROGRESS IN PHOTOVOLTAICS, 2011, 19 (03): : 313 - 319
- [23] CONCERNING THE UTILIZATION OF THE PHASE METHOD FOR MEASURING LIFETIME OF NONEQUILIBRIUM CHARGE CARRIERS IN SEMICONDUCTORS SOVIET PHYSICS-SOLID STATE, 1961, 3 (03): : 674 - 679
- [24] A Contactless Method for Measuring the Lifetimes of Nonequilibrium Charge Carriers in Semiconductors Instruments and Experimental Techniques, 2003, 46 : 388 - 390
- [26] METHOD FOR MEASURING NONEQUILIBRIUM CARRIER LIFETIME IN EPITAXIAL FILMS SOVIET PHYSICS SEMICONDUCTORS-USSR, 1972, 6 (04): : 596 - &
- [28] NEW CONTACTLESS METHOD FOR LIFETIME MEASUREMENT IN SEMICONDUCTOR WAFERS REVIEW OF SCIENTIFIC INSTRUMENTS, 1983, 54 (10): : 1386 - 1391
- [29] POSSIBILITY OF CONTACTLESS MEASUREMENT OF FREE CHARGE CARRIER MOBILITY IN SEMICONDUCTORS BY THE UHF RESONATOR METHOD. Soviet physics journal, 1985, 28 (07): : 546 - 549
- [30] PHOTOCONDUCTIVITY AND NONEQUILIBRIUM CARRIER LIFETIME DURING PHASE TRANSITION IN SBSI SOVIET PHYSICS SOLID STATE,USSR, 1966, 8 (01): : 113 - +